Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry (Record no. 200457695)

MARC details
000 -LEADER
fixed length control field 03186nam a22004935i 4500
003 - CONTROL NUMBER IDENTIFIER
control field TR-AnTOB
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20231116102434.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 211116s2022 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783658359263
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-658-35926-3
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency TR-AnTOB
Language of cataloging eng
Description conventions rda
Transcribing agency TR-AnTOB
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title İngilizce
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC411
072 #7 - SUBJECT CATEGORY CODE
Subject category code TTBL
Source bicssc
Subject category code SCI053000
Source bisacsh
Subject category code TTBL
Source thema
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) QC411EBK
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Taudt, Christopher.
Relator term author.
Relator code aut
-- http://id.loc.gov/vocabulary/relators/aut
245 10 - TITLE STATEMENT
Title Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
Medium [electronic resource] /
Statement of responsibility, etc. by Christopher Taudt.
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2022.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Wiesbaden :
Name of producer, publisher, distributor, manufacturer Springer Fachmedien Wiesbaden :
-- Imprint: Springer Vieweg,
Date of production, publication, distribution, manufacture, or copyright notice 2022.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note 1 Introduction and motivation -- 2 Related works and basic considerations -- 3 Surface profilometry -- 4 Polymer characterization -- 5 Thin-film characterization -- 6 Conclusion.
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
520 ## - SUMMARY, ETC.
Summary, etc. This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Lasers.
Topical term or geographic name entry element Optical measurements.
Topical term or geographic name entry element Metrology.
Topical term or geographic name entry element Laser Technology.
Topical term or geographic name entry element Optical Metrology.
653 #0 - INDEX TERM--UNCONTROLLED
Uncontrolled term Interferometry
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-3-658-35926-3">https://doi.org/10.1007/978-3-658-35926-3</a>
Materials specified Springer eBooks
Public note Online access link to the resource
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type E-Book

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