Reliability of Organic Compounds in Microelectronics and Optoelectronics (Record no. 200458264)

MARC details
000 -LEADER
fixed length control field 04296nam a22005415i 4500
003 - CONTROL NUMBER IDENTIFIER
control field TR-AnTOB
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20231124091510.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220131s2022 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783030815769
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-030-81576-9
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency TR-AnTOB
Language of cataloging eng
Description conventions rda
Transcribing agency TR-AnTOB
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title İngilizce
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
Subject category code TEC008010
Source bisacsh
Subject category code TJFC
Source thema
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7871EBK
245 10 - TITLE STATEMENT
Title Reliability of Organic Compounds in Microelectronics and Optoelectronics
Medium [electronic resource] :
Remainder of title From Physics-of-Failure to Physics-of-Degradation /
Statement of responsibility, etc. edited by Willem Dirk van Driel, Maryam Yazdan Mehr.
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2022.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cham :
Name of producer, publisher, distributor, manufacturer Springer International Publishing :
-- Imprint: Springer,
Date of production, publication, distribution, manufacture, or copyright notice 2022.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin.-Discussions and concluding remarks -- Index.
520 ## - SUMMARY, ETC.
Summary, etc. This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electronic circuits.
Topical term or geographic name entry element Electronics.
Topical term or geographic name entry element Solid state physics.
Topical term or geographic name entry element Electronic Circuits and Systems.
Topical term or geographic name entry element Electronics and Microelectronics, Instrumentation.
Topical term or geographic name entry element Electronic Devices.
653 #0 - INDEX TERM--UNCONTROLLED
Uncontrolled term Microelectronics -- Materials
Uncontrolled term Optoelectronics -- Materials
Uncontrolled term Functional organic materials -- Deterioration
Uncontrolled term Functional organic materials -- Fatigue
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name van Driel, Willem Dirk.
Relator term editor.
Relator code edt
-- http://id.loc.gov/vocabulary/relators/edt
Personal name Yazdan Mehr, Maryam.
Relator term editor.
Relator code edt
-- http://id.loc.gov/vocabulary/relators/edt
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-3-030-81576-9">https://doi.org/10.1007/978-3-030-81576-9</a>
Materials specified Springer eBooks
Public note Online access link to the resource
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type E-Book
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Not for loan Collection code Home library Current library Date acquired Source of acquisition Inventory number Total Checkouts Full call number Barcode Date last seen Copy number Date shelved Koha item type Public note
    Library of Congress Classification Geçerli değil-e-Kitap / Not applicable-e-Book E-Kitap Koleksiyonu Merkez Kütüphane Merkez Kütüphane 11/10/2023 Satın Alma / Purchase ELE/MBN   TK7871EBK EBK03420 24/11/2023 1 24/11/2023 E-Book
Devinim Yazılım Eğitim Danışmanlık tarafından Koha'nın orjinal sürümü uyarlanarak geliştirilip kurulmuştur.