MARC details
000 -LEADER |
fixed length control field |
03191nam a22005535i 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
TR-AnTOB |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20231116161120.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
220209s2022 si | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9789811651014 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/978-981-16-5101-4 |
Source of number or code |
doi |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
TR-AnTOB |
Language of cataloging |
eng |
Description conventions |
rda |
Transcribing agency |
TR-AnTOB |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
İngilizce |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
QH212.E4 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TGM |
Source |
bicssc |
|
Subject category code |
TEC021000 |
Source |
bisacsh |
|
Subject category code |
TGM |
Source |
thema |
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
QH212.E4EBK |
245 10 - TITLE STATEMENT |
Title |
Electron Microscopy in Science and Engineering |
Medium |
[electronic resource] / |
Statement of responsibility, etc. |
edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao. |
250 ## - EDITION STATEMENT |
Edition statement |
1st ed. 2022. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Singapore : |
Name of producer, publisher, distributor, manufacturer |
Springer Nature Singapore : |
-- |
Imprint: Springer, |
Date of production, publication, distribution, manufacture, or copyright notice |
2022. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
1 online resource |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
490 1# - SERIES STATEMENT |
Series statement |
IITK Directions, |
International Standard Serial Number |
2509-6605 ; |
Volume/sequential designation |
6 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Small scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials. |
|
Topical term or geographic name entry element |
Spectrum analysis. |
|
Topical term or geographic name entry element |
Building materials. |
|
Topical term or geographic name entry element |
Materials Engineering. |
|
Topical term or geographic name entry element |
Spectroscopy. |
|
Topical term or geographic name entry element |
Structural Materials. |
653 #0 - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Electron microscopy |
|
Uncontrolled term |
Industrial applications |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Biswas, Krishanu. |
Relator term |
editor. |
Relator code |
edt |
-- |
http://id.loc.gov/vocabulary/relators/edt |
|
Personal name |
Sivakumar, Sri. |
Relator term |
editor. |
Relator code |
edt |
-- |
http://id.loc.gov/vocabulary/relators/edt |
|
Personal name |
Gurao, Nilesh. |
Relator term |
editor. |
Relator code |
edt |
-- |
http://id.loc.gov/vocabulary/relators/edt |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
IITK Directions, |
International Standard Serial Number |
2509-6605 ; |
Volume/sequential designation |
6 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="https://doi.org/10.1007/978-981-16-5101-4">https://doi.org/10.1007/978-981-16-5101-4</a> |
Materials specified |
Springer eBooks |
Public note |
Online access link to the resource |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Library of Congress Classification |
Koha item type |
E-Book |