MARC details
000 -LEADER |
fixed length control field |
01516 a2200313 4500 |
001 - CONTROL NUMBER |
control field |
73360 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
TR-AnTOB |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20200505114445.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
090109s2004 nyua 001 0 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0471232793 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
CQU |
Transcribing agency |
CQU |
Modifying agency |
BGU |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
İngilizce |
049 ## - LOCAL HOLDINGS (OCLC) |
Holding library |
OSUU |
050 ## - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7871.85 |
Item number |
.M39 2004 |
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7871.85 .M39 2004 |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
May, Gary S. |
9 (RLIN) |
51156 |
245 #0 - TITLE STATEMENT |
Title |
Fundamentals of semiconductor fabrication / |
Statement of responsibility, etc. |
Gary S. May, Simon M. Sze. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
New York: |
Name of producer, publisher, distributor, manufacturer |
Wiley, |
Date of production, publication, distribution, manufacture, or copyright notice |
c2004. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xiii, 305 p. : |
Other physical details |
ill. ; |
Dimensions |
26 cm. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
|
505 #0 - FORMATTED CONTENTS NOTE |
Formatted contents note |
Ch.1. |
Miscellaneous information |
Ch.2. |
-- |
Ch.3.Silicon Oxidation-- |
-- |
Ch.4. |
-- |
Ch.5. |
-- |
Ch.6 |
-- |
Ch.7.t |
-- |
Ch.8. |
-- |
Ch.9. |
-- |
Ch.10. |
-- |
Ch.11. |
Title |
Introduction-- |
-- |
Crystal Growth-- |
-- |
Photolithography-- |
-- |
Etching-- |
-- |
Diffusion-- |
-- |
Film Deposition-- |
-- |
Process Integration-- |
-- |
IC Manufacturing-- |
-- |
Future Trends and Challenges App. B International System of Units (SI Units) App. C Unit Prefixes App. D Greek Alphabet App. E Physical Constants App. F Properties of Si and GaAs at 300 K App. G Some Properties of the Error Function App. H Basic Kinetic Theory of Gases App. I SUPREM Commands App. J Running PROLITH App. K Percentage Points of the t Distribution App. L Percentage Points of the F Distribution |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Yarı iletkenler |
General subdivision |
Tasarım ve yapım |
9 (RLIN) |
21751 |
|
Topical term or geographic name entry element |
Semiconductors |
General subdivision |
Design and construction |
9 (RLIN) |
889 |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Sze, Simon M., |
Dates associated with a name |
1936- |
9 (RLIN) |
51157 |
902 ## - LOCAL DATA ELEMENT B, LDB (RLIN) |
a |
0027705 |
903 ## - LOCAL DATA ELEMENT C, LDC (RLIN) |
a |
Merkez Kütüphane |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Book |
Source of classification or shelving scheme |
Library of Congress Classification |
945 ## - LOCAL PROCESSING INFORMATION (OCLC) |
a |
Kntrl CS |