Fundamentals of semiconductor fabrication / (Record no. 73360)

MARC details
000 -LEADER
fixed length control field 01516 a2200313 4500
001 - CONTROL NUMBER
control field 73360
003 - CONTROL NUMBER IDENTIFIER
control field TR-AnTOB
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200505114445.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090109s2004 nyua 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0471232793
040 ## - CATALOGING SOURCE
Original cataloging agency CQU
Transcribing agency CQU
Modifying agency BGU
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title İngilizce
049 ## - LOCAL HOLDINGS (OCLC)
Holding library OSUU
050 ## - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.85
Item number .M39 2004
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7871.85 .M39 2004
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name May, Gary S.
9 (RLIN) 51156
245 #0 - TITLE STATEMENT
Title Fundamentals of semiconductor fabrication /
Statement of responsibility, etc. Gary S. May, Simon M. Sze.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New York:
Name of producer, publisher, distributor, manufacturer Wiley,
Date of production, publication, distribution, manufacture, or copyright notice c2004.
300 ## - PHYSICAL DESCRIPTION
Extent xiii, 305 p. :
Other physical details ill. ;
Dimensions 26 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note
505 #0 - FORMATTED CONTENTS NOTE
Formatted contents note Ch.1.
Miscellaneous information Ch.2.
-- Ch.3.Silicon Oxidation--
-- Ch.4.
-- Ch.5.
-- Ch.6
-- Ch.7.t
-- Ch.8.
-- Ch.9.
-- Ch.10.
-- Ch.11.
Title Introduction--
-- Crystal Growth--
-- Photolithography--
-- Etching--
-- Diffusion--
-- Film Deposition--
-- Process Integration--
-- IC Manufacturing--
-- Future Trends and Challenges App. B International System of Units (SI Units) App. C Unit Prefixes App. D Greek Alphabet App. E Physical Constants App. F Properties of Si and GaAs at 300 K App. G Some Properties of the Error Function App. H Basic Kinetic Theory of Gases App. I SUPREM Commands App. J Running PROLITH App. K Percentage Points of the t Distribution App. L Percentage Points of the F Distribution
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Yarı iletkenler
General subdivision Tasarım ve yapım
9 (RLIN) 21751
Topical term or geographic name entry element Semiconductors
General subdivision Design and construction
9 (RLIN) 889
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Sze, Simon M.,
Dates associated with a name 1936-
9 (RLIN) 51157
902 ## - LOCAL DATA ELEMENT B, LDB (RLIN)
a 0027705
903 ## - LOCAL DATA ELEMENT C, LDC (RLIN)
a Merkez Kütüphane
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book
Source of classification or shelving scheme Library of Congress Classification
945 ## - LOCAL PROCESSING INFORMATION (OCLC)
a Kntrl CS
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Materials specified (bound volume or other part) Not for loan Collection code Home library Current library Shelving location Date acquired Source of acquisition Serial Enumeration / chronology Inventory number Total Checkouts Total Holds Full call number Barcode Copy number Date shelved Koha item type
      C.1 Ödünç Verilebilir / Available Genel Koleksiyon Merkez Kütüphane Merkez Kütüphane Genel Koleksiyon / Main Collection 09/12/2009 Satın Alma / Purchase 1 ELE/MBN     TK7871.85 .M39 2004 0027705 1 21/04/2010 Book
Devinim Yazılım Eğitim Danışmanlık tarafından Koha'nın orjinal sürümü uyarlanarak geliştirilip kurulmuştur.