Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 132512

003 - CONTROL NUMBER IDENTIFIER

• control field: TR-AnTOB

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20210906102434.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 880324n|eazannbab| |a ana d

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

• LC control number: sh 88001717

035 ## - SYSTEM CONTROL NUMBER

• System control number: (TR-AnTOB)132512

040 ## - CATALOGING SOURCE

• Original cataloging agency: DLC
• Language of cataloging: eng
• Description conventions: rda
• Transcribing agency: DLC
• Modifying agency: TR-AnTOB

053 ## - LC CLASSIFICATION NUMBER

• Classification number element--single number or beginning number of span: TA169.3

150 #0 - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Accelerated life testing

450 #0 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Accelerated testing

450 #0 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Life testing, Accelerated

450 #0 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Reliability testing

550 #0 - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Testing

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: Intl. Sch. of Physics "Enrico Fermi" (1986 : Lerici, Italy). Accelerated life testing and expert's opinions in reliability, 1988:
• Information found: CIP galley (accelerated life tests: equipment is subjected to substantially more strain than it will receive in normal operation, and, as a result, fails more often)

670 ## - SOURCE DATA FOUND

• Source citation: INSPEC
• Information found: (accelerated testing: UF life testing; BT testing; RT Reliability)

670 ## - SOURCE DATA FOUND

• Source citation: NASA
• Information found: (accelerated life tests)

670 ## - SOURCE DATA FOUND

• Source citation: TEST
• Information found: (life tests)

670 ## - SOURCE DATA FOUND

• Source citation: Engr. index, 1986:
• Information found: p. 7968⁺, under Reliability--Testing (accelerated life testing, reliability testing)

670 ## - SOURCE DATA FOUND

• Source citation: ASTI, 1987:
• Information found: under Reliability (Engineering) (accelerated testing, reliability testing)

670 ## - SOURCE DATA FOUND

• Source citation: McGraw-Hill dict. sci. tech.
• Information found: (accelerated life test: operation of a device, circuit, or system above maximum ratings to produce premature failure; used to establish normal operating life)

675 ## - SOURCE DATA NOT FOUND

• Source citation: Web. 3;
• Source citation: Hennepin

688 ## - APPLICATION HISTORY NOTE

• Institution to which field applies: TR-AnTOB
• Application history note: BS 6.9.2021

750 ## - ESTABLISHED HEADING LINKING ENTRY--TOPICAL TERM

• Authority record control number or standard number: http://id.loc.gov/authorities/subjects/sh85098844
• Source of heading or term: lcsh