Normal view
MARC view
- Rieder, Evan A.
Entry Personal Name
001 - CONTROL NUMBER
- control field: 143152
003 - CONTROL NUMBER IDENTIFIER
- control field: TR-AnTOB
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20241115090349.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 201007n| azannaabn |n aaa
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
- LC control number: n 2020185655
035 ## - SYSTEM CONTROL NUMBER
- System control number: (TR-AnTOB)143152
040 ## - CATALOGING SOURCE
- Original cataloging agency: DNLM
- Language of cataloging: eng
- Description conventions: rda
- Transcribing agency: DNLM
- Modifying agency: TR-AnTOB
100 1# - HEADING--PERSONAL NAME
- Personal name: Rieder, Evan A.
370 ## - ASSOCIATED PLACE
- Other associated place: New York (N.Y.)
- Source of term: naf
372 ## - FIELD OF ACTIVITY
- Field of activity: Dermatology
- Source of term: mesh
373 ## - ASSOCIATED GROUP
- Associated group: New York University. Department of Dermatology
- Source of term: naf
374 ## - OCCUPATION
- Occupation: Dermatologists
- Source of term: mesh
670 ## - SOURCE DATA FOUND
- Source citation: Essential psychiatry for the aesthetic practitioner, 2021:
- Information found: ECIP title page (Evan A. Rieder, MD, FAAD; The Ronald O. Perelman Department of Dermatology, New York University Grossman School of Medicine, New York, NY, USA)