Microstructural characterization of materials / David Brandon and Wayne D. Kaplan.
Language: İngilizce Publisher: Chichester ; New York : J. Wiley, c1999Description: xiii, 409 p. : ill. ; 24 cmISBN:- 0471985015 (cloth : alk. paper)
- 0471985023 (paper : alk. paper)
- TA417.23 .B73 1999
| Item type | Current library | Home library | Collection | Call number | Vol info | Copy number | Status | Date due | Barcode | |
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Merkez Kütüphane Genel Koleksiyon / Main Collection | Merkez Kütüphane | Genel Koleksiyon | TA417.23 .B73 1999 (Browse shelf(Opens below)) | 1 | 1 | Available | 0018122 | ||
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Merkez Kütüphane Genel Koleksiyon / Main Collection | Merkez Kütüphane | Genel Koleksiyon | TA417.23 .B73 1999 (Browse shelf(Opens below)) | 1 | 2 | Available | 0018125 |
Browsing Merkez Kütüphane shelves, Shelving location: Genel Koleksiyon / Main Collection, Collection: Genel Koleksiyon Close shelf browser (Hides shelf browser)
| TA417.2 .L58 2003 Computational inverse techniques in nondestructive evaluation / | TA 417.2 .M59 2005 Introduction to nondestructive testing : | TA417.23 .B73 1999 Microstructural characterization of materials / | TA417.23 .B73 1999 Microstructural characterization of materials / | TA417.23 .B73 2008 Microstructural characterization of materials / | TA417.23 .F85 2008 Transmission electron microscopy and diffractometry of materials / | TA417.6 .H46 1996 Deformation and fracture mechanics of engineering materials / |
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