Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.
Language: İngilizce Publisher: Berlin ; New York : Springer, 2008Description: xix, 758 p. : ill. ; 24 cmISBN:- 9783540738862
- 354073886X
- TA417.23 .F85 2008
| Item type | Current library | Home library | Collection | Call number | Vol info | Copy number | Status | Date due | Barcode | |
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Book
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Merkez Kütüphane Genel Koleksiyon / Main Collection | Merkez Kütüphane | Genel Koleksiyon | TA417.23 .F85 2008 (Browse shelf(Opens below)) | 1 | 1 | Available | 0028357 |
Browsing Merkez Kütüphane shelves, Shelving location: Genel Koleksiyon / Main Collection, Collection: Genel Koleksiyon Close shelf browser (Hides shelf browser)
| TA417.23 .B73 1999 Microstructural characterization of materials / | TA417.23 .B73 1999 Microstructural characterization of materials / | TA417.23 .B73 2008 Microstructural characterization of materials / | TA417.23 .F85 2008 Transmission electron microscopy and diffractometry of materials / | TA417.6 .H46 1996 Deformation and fracture mechanics of engineering materials / | TA418.16 .F74 1990 Failure analysis of brittle materials / | TA418.16 .T46 2004 Tensile testing / |
Diffraction and the x-ray powder diffractometer -- The TEM and its optics -- Scattering -- Inelastic electron scattering and spectroscopy -- Diffraction from crystals -- Electron diffraction and crystallography -- Diffraction contrast in TEM images -- Diffraction lineshapes -- Patterson functions and diffuse scattering -- High-resolution TEM imaging -- High-resolution STEM imaging -- Dynamical theory.
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