TY  - BOOK
AU  - Jenkins,Keith A.
ED  - SpringerLink (Online service)
TI  - RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
SN  - 9783030777753
AV  - TK7871.95 
PY  - 2022///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - Electronic circuits
KW  - Electronics
KW  - Telecommunication
KW  - Electronic Circuits and Systems
KW  - Electronics and Microelectronics, Instrumentation
KW  - Microwaves, RF Engineering and Optical Communications
KW  - Field-effect transistors
N1  - Introduction -- Signal propagation & connection to devices -- Frequency characterization of devices -- Spectral analysis techniques -- Device propagation delay -- Jitter measurement -- Transient and time-dependent phenomena
N2  - This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs. Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understand the relationship between these measurements and traditional, conventional DC characteristics.
UR  - https://doi.org/10.1007/978-3-030-77775-3
ER  -