TY  - GEN
AU  - Ohring, Milton,
TI  - Reliability and failure of electronic materials and devices
SN  - 0125249853 (alk. paper)
AV  - TK7870.23 .O37 1998
PY  - 1998///
CY  - San Diego
PB  - Academic Press
KW  - Sistem arızaları (Mühendislik)
KW  - etuturkob
KW  - System failures (Engineering)
KW  - Elektronik aygıtlar ve aletler
KW  - Güvenilirlik
KW  - Electronic apparatus and appliances
KW  - Reliability
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/description/els033/98016084.html
ER  -