VLSI test principles and architectures : design for testability /
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
- xxx, 777 p. : ill. ; 25 cm.
- The Morgan Kaufmann series in systems on silicon .
0123705975 (hardcover : alk. paper) 9780123705976
2006006869
Integrated circuits--Very large scale integration--Testing Entegre devreler--Çok büyük ölçekli entegrasyon--Tasarım Integrated circuits--Very large scale integration--Design Entegre devreler--Çok geniş ölçekli tümleşim--Test etme