VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - xxx, 777 p. : ill. ; 25 cm. - The Morgan Kaufmann series in systems on silicon .



0123705975 (hardcover : alk. paper) 9780123705976

2006006869


Integrated circuits--Very large scale integration--Testing
Entegre devreler--Çok büyük ölçekli entegrasyon--Tasarım
Integrated circuits--Very large scale integration--Design
Entegre devreler--Çok geniş ölçekli tümleşim--Test etme

TK7874.75 / .V58 2006