TY  - GEN
AU  - Wu, Cheng-Wen,
AU  - Wang, Laung-Terng
AU  - Wen, Xiaoqing
TI  - VLSI test principles and architectures: design for testability 
T2  - The Morgan Kaufmann series in systems on silicon
SN  - 0123705975 (hardcover : alk. paper)
AV  - TK7874.75 .V58 2006
PY  - 2006///
CY  - Amsterdam, Boston
PB  - Elsevier Morgan Kaufmann Publishers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Entegre devreler
KW  - Çok büyük ölçekli entegrasyon
KW  - Tasarım
KW  - Design
KW  - Çok geniş ölçekli tümleşim
KW  - Test etme
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/toc/ecip069/2006006869.html
ER  -