TY  - GEN
AU  - Brandon, D. G.
AU  - Kaplan, Wayne D.
TI  - Microstructural characterization of materials
SN  - 0471985015 (cloth : alk. paper)
AV  - TA417.23 .B73 1999
PY  - 1999///
CY  - Chichester, New York
PB  - J. Wiley
KW  - Materials
KW  - Microscopy
KW  - Microstructure
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/description/wiley033/98046589.html
ER  -