Leng, Yang <br/><br/>
Materials characterization :  introduction to microscopic and spectroscopic methods / 
Yang Leng. 
 - xii, 337 p. :  ill. ;  26 cm. 
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<br/><br/>X-ray Radiation--Light Microscopy--  Optical Principles --  Instrumentation--  Specimen Preparation --  Imaging Modes --  Confocal Microscopy --  X-ray Diffraction Methods --  Theoretical Background of Diffraction --  X-ray Diffractometry--  Transmission Electron Microscopy--  Instrumentation--  Specimen Preparation --  Image Modes --  Selected Area Diffraction --  Images of Crystal Defects --  Scanning Electron Microscopy --  Instrumentation--  Contrast Formation --  Operational Variables --  Specimen Preparation --  Scanning Probe Microscopy --  Instrumentation --  Scanning Tunneling Microscopy --  Atomic Force Microscopy --  Image Artifacts --  X-ray Spectroscopy for Elemental Analysis --  Features of Characteristic X-rays --  X-ray Fluorescence Spectrometry --  Energy Dispersive Spectroscopy in Electron Microscopes --  Qualitative and Quantitative Analysis --  Electron Spectroscopy for Surface Analysis --  Basic Principles --  Instrumentation--  Characteristics of Electron Spectra --  Qualitative and Quantitative Analysis --  Secondary Ion Mass Spectrometry for Surface Analysis --  Basic Principles --  Instrumentation--  Surface Structure Analysis --  SIMS Imaging --  SIMS Depth Profiling --  Vibrational Spectroscopy for Molecular Analysis --  Theoretical Background --  Fourier Transform Infrared Spectroscopy --  Raman Microscopy --  Interpretation of Vibrational Spectra --  Thermal Analysis --  Common Characteristics --  Differential Thermal Analysis and Differential Scanning Calorimetry--  Thermogravimetry --  Index 
<br/><br/><label>ISBN: </label>9780470822982 (cloth : alk. paper) 0470822988 (cloth : alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Malzemeler<br/>Materials<br/>Materials--Analysis<br/>Malzemeler--Analiz
<br/><br/><label>LC Class. No.: </label>TA403  / .L46 2008