TY  - GEN
AU  - Leng, Yang
TI  - Materials characterization: introduction to microscopic and spectroscopic methods 
SN  - 9780470822982 (cloth : alk. paper)
AV  - TA403 .L46 2008
PY  - 2008///
CY  - Singapore, Hoboken, NJ
PB  - J. Wiley
KW  - Malzemeler
KW  - etuturkob
KW  - Materials
KW  - Analysis
KW  - Analiz
N1  - Includes bibliographical references and index; X-ray Radiation--Light Microscopy--; Optical Principles --; Instrumentation--; Specimen Preparation --; Imaging Modes --; Confocal Microscopy --; X-ray Diffraction Methods --; Theoretical Background of Diffraction --; X-ray Diffractometry--; Transmission Electron Microscopy--; Instrumentation--; Specimen Preparation --; Image Modes --; Selected Area Diffraction --; Images of Crystal Defects --; Scanning Electron Microscopy --; Instrumentation--; Contrast Formation --; Operational Variables --; Specimen Preparation --; Scanning Probe Microscopy --; Instrumentation --; Scanning Tunneling Microscopy --; Atomic Force Microscopy --; Image Artifacts --; X-ray Spectroscopy for Elemental Analysis --; Features of Characteristic X-rays --; X-ray Fluorescence Spectrometry --; Energy Dispersive Spectroscopy in Electron Microscopes --; Qualitative and Quantitative Analysis --; Electron Spectroscopy for Surface Analysis --; Basic Principles --; Instrumentation--; Characteristics of Electron Spectra --; Qualitative and Quantitative Analysis --; Secondary Ion Mass Spectrometry for Surface Analysis --; Basic Principles --; Instrumentation--; Surface Structure Analysis --; SIMS Imaging --; SIMS Depth Profiling --; Vibrational Spectroscopy for Molecular Analysis --; Theoretical Background --; Fourier Transform Infrared Spectroscopy --; Raman Microscopy --; Interpretation of Vibrational Spectra --; Thermal Analysis --; Common Characteristics --; Differential Thermal Analysis and Differential Scanning Calorimetry--; Thermogravimetry --; Index
ER  -