Fultz, Brent <br/><br/>
Transmission electron microscopy and diffractometry of materials / 
Brent Fultz, James Howe. 
 - xix, 758 p. :  ill. ;  24 cm. 
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<br/><br/>Diffraction and the x-ray powder diffractometer --  The TEM and its optics --  Scattering --  Inelastic electron scattering and spectroscopy --  Diffraction from crystals --  Electron diffraction and crystallography --  Diffraction contrast in TEM images --  Diffraction lineshapes --  Patterson functions and diffuse scattering --  High-resolution TEM imaging --  High-resolution STEM imaging --  Dynamical theory. 
<br/><br/><label>ISBN: </label>9783540738862 354073886X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray diffractometer<br/>X-ray difraktometre<br/>Transmisyon elektron mikroskopi<br/>Transmission electron microscopy<br/>Malzemeler--Mikroskopi<br/>Materials--Microscopy
<br/><br/><label>LC Class. No.: </label>TA417.23  / .F85 2008