TY  - GEN
AU  - Fultz, Brent
AU  - Howe, James M.,
TI  - Transmission electron microscopy and diffractometry of materials
SN  - 9783540738862
AV  - TA417.23 .F85 2008
PY  - 2008///
CY  - Berlin, New York
PB  - Springer
KW  - X-ray diffractometer
KW  - X-ray difraktometre
KW  - etuturkob
KW  - Transmisyon elektron mikroskopi
KW  - Transmission electron microscopy
KW  - Malzemeler
KW  - Mikroskopi
KW  - Materials
KW  - Microscopy
N1  - Includes bibliographies and index; Kaynakça: s.677-689 ve dizin; Diffraction and the x-ray powder diffractometer --; The TEM and its optics --; Scattering --; Inelastic electron scattering and spectroscopy --; Diffraction from crystals --; Electron diffraction and crystallography --; Diffraction contrast in TEM images --; Diffraction lineshapes --; Patterson functions and diffuse scattering --; High-resolution TEM imaging --; High-resolution STEM imaging --; Dynamical theory
ER  -