Brandon, D. G. <br/><br/>
Microstructural characterization of materials / 
David Brandon and Wayne D. Kaplan. 
 - 2nd ed. 
 - xiv, 536 p. :  ill. (some col.) ;  25 cm. 
 - Quantitative software engineering series. .
<br/><br/>
<br/><br/><label>ISBN: </label>0470027843 (cloth) 9780470027844 (cloth) 0470027851 (pbk.) 9780470027851 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Malzemeler--Mikroskopi<br/>Materials--Microscopy<br/>Microstructure<br/>Mikroyapı
<br/><br/><label>LC Class. No.: </label>TA417.23  / .B73 2008