TY  - GEN
AU  - Brandon, D. G.
AU  - Kaplan, Wayne D.
TI  - Microstructural characterization of materials
T2  - Quantitative software engineering series
SN  - 0470027843 (cloth)
AV  - TA417.23 .B73 2008
PY  - 2008///
CY  - Chichester, England
PB  - John Wiley
KW  - Malzemeler
KW  - Mikroskopi
KW  - Materials
KW  - Microscopy
KW  - Microstructure
KW  - Mikroyapı
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html
ER  -