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Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe. by
Language: İngilizce Publisher: Berlin ; New York : Springer, 2008
Availability: Items available for loan: Merkez Kütüphane (1)Collection, call number: Genel Koleksiyon TA417.23 .F85 2008.

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Microstructural characterization of materials / David Brandon and Wayne D. Kaplan. by Series: Quantitative software engineering series
Edition: 2nd ed.
Language: İngilizce Publisher: Chichester, England : John Wiley, c2008
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Availability: Items available for loan: Merkez Kütüphane (1)Collection, call number: Genel Koleksiyon TA417.23 .B73 2008.

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Devinim Yazılım Eğitim Danışmanlık tarafından Koha'nın orjinal sürümü uyarlanarak geliştirilip kurulmuştur.