Materials characterization : introduction to microscopic and spectroscopic methods / Yang Leng.

X-ray Radiation--Light Microscopy-- Optical Principles -- Instrumentation-- Specimen Preparation -- Imaging Modes -- Confocal Microscopy -- X-ray Diffraction Methods -- Theoretical Background of Diffraction -- X-ray Diffractometry-- Transmission Electron Microscopy-- Instrumentation-- Specimen Preparation -- Image Modes -- Selected Area Diffraction -- Images of Crystal Defects -- Scanning Electron Microscopy -- Instrumentation-- Contrast Formation -- Operational Variables -- Specimen Preparation -- Scanning Probe Microscopy -- Instrumentation -- Scanning Tunneling Microscopy -- Atomic Force Microscopy -- Image Artifacts -- X-ray Spectroscopy for Elemental Analysis -- Features of Characteristic X-rays -- X-ray Fluorescence Spectrometry -- Energy Dispersive Spectroscopy in Electron Microscopes -- Qualitative and Quantitative Analysis -- Electron Spectroscopy for Surface Analysis -- Basic Principles -- Instrumentation-- Characteristics of Electron Spectra -- Qualitative and Quantitative Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Basic Principles -- Instrumentation-- Surface Structure Analysis -- SIMS Imaging -- SIMS Depth Profiling -- Vibrational Spectroscopy for Molecular Analysis -- Theoretical Background -- Fourier Transform Infrared Spectroscopy -- Raman Microscopy -- Interpretation of Vibrational Spectra -- Thermal Analysis -- Common Characteristics -- Differential Thermal Analysis and Differential Scanning Calorimetry-- Thermogravimetry -- Index