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Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.

By: Contributor(s): Language: İngilizce Publisher: Berlin ; New York : Springer, 2008Description: xix, 758 p. : ill. ; 24 cmISBN:
  • 9783540738862
  • 354073886X
Subject(s): LOC classification:
  • TA417.23 .F85 2008
Contents:
Diffraction and the x-ray powder diffractometer -- The TEM and its optics -- Scattering -- Inelastic electron scattering and spectroscopy -- Diffraction from crystals -- Electron diffraction and crystallography -- Diffraction contrast in TEM images -- Diffraction lineshapes -- Patterson functions and diffuse scattering -- High-resolution TEM imaging -- High-resolution STEM imaging -- Dynamical theory.
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Item type Current library Home library Collection Call number Vol info Copy number Status Date due Barcode
Book Book Merkez Kütüphane Genel Koleksiyon / Main Collection Merkez Kütüphane Genel Koleksiyon TA417.23 .F85 2008 (Browse shelf(Opens below)) 1 1 Available 0028357

Diffraction and the x-ray powder diffractometer -- The TEM and its optics -- Scattering -- Inelastic electron scattering and spectroscopy -- Diffraction from crystals -- Electron diffraction and crystallography -- Diffraction contrast in TEM images -- Diffraction lineshapes -- Patterson functions and diffuse scattering -- High-resolution TEM imaging -- High-resolution STEM imaging -- Dynamical theory.

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