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VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Series: The Morgan Kaufmann series in systems on silicon
Language: İngilizce Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006
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Availability: Items available for loan: Merkez Kütüphane (1)Collection, call number: Genel Koleksiyon TK7874.75 .V58 2006.

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Real-life MDA : solving business problems with model driven architecture / Michael Guttman, John Parodi. by Series: Morgan Kaufmann OMG Press
Language: İngilizce Publisher: Amsterdam ; Boston : Elsevier/Morgan Kaufmann Publishers, c2007
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Availability: Items available for loan: Merkez Kütüphane (1)Collection, call number: Genel Koleksiyon HD30.2 .G884 2007.

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Devinim Yazılım Eğitim Danışmanlık tarafından Koha'nın orjinal sürümü uyarlanarak geliştirilip kurulmuştur.