VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

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Language: İngilizce Series: The Morgan Kaufmann series in systems on siliconPublisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Description: xxx, 777 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Vol info	Copy number	Status	Date due	Barcode
Book	Merkez Kütüphane Genel Koleksiyon / Main Collection	Merkez Kütüphane	Genel Koleksiyon	TK7874.75 .V58 2006 (Browse shelf(Opens below))	1	1	Available		0017158

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