VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Contributor(s): Wu, Cheng-Wen, EE Ph. D
| Wang, Laung-Terng | Wen, Xiaoqing
Language: İngilizce Series: The Morgan Kaufmann series in systems on siliconPublisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Description: xxx, 777 p. : ill. ; 25 cmISBN: 0123705975 (hardcover : alk. paper); 9780123705976Subject(s): Integrated circuits -- Very large scale integration -- Testing | Entegre devreler -- Çok büyük ölçekli entegrasyon -- Tasarım | Integrated circuits -- Very large scale integration -- Design | Entegre devreler -- Çok geniş ölçekli tümleşim -- Test etmeLOC classification: TK7874.75 | .V58 2006Online resources: Table of contents
| Item type | Current location | Home library | Collection | Call number | Vol info | Copy number | Status | Date due | Barcode |
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Book
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Merkez Kütüphane Genel Koleksiyon / Main Collection | Merkez Kütüphane | Genel Koleksiyon | TK7874.75 .V58 2006 (Browse shelf) | 1 | 1 | Available | 0017158 |
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