Microstructural characterization of materials / David Brandon and Wayne D. Kaplan.

By:

Contributor(s):

Language: İngilizce Series: Quantitative software engineering seriesPublisher: Chichester, England : John Wiley, c2008Edition: 2nd edDescription: xiv, 536 p. : ill. (some col.) ; 25 cmISBN:

Subject(s):

LOC classification:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Collection	Call number	Vol info	Copy number	Status	Date due	Barcode
Book	Merkez Kütüphane Genel Koleksiyon / Main Collection	Merkez Kütüphane	Genel Koleksiyon	TA417.23 .B73 2008 (Browse shelf(Opens below))	1	1	Available		0031664

There are no comments on this title.

to post a comment.

Back to results