000 01381 a2200313 4500
001 200420598
650 0 0 _9122552
_aX-ray crystallography
999 _c200420598
_d36586
003 TR-AnTOB
005 20190408221152.0
008 141127b tu 000 0
020 _a9783642166341
040 _aTR-AnTOB
_btur
_erda
041 0 _aeng
050 0 0 _aQD954
_b.W37 2011
090 _aQD954 .W37 2011
100 1 _aWaseda, Yoshio
_937825
245 1 0 _aX-ray diffraction crystallography :
_bintroduction, examples and solved problems /
_cYoshio Waseda, Eiichiro Matsubara, Kozo Shinoda.
264 _aNew York :
_bSpringer ,
_c2011.
300 _axi, 310 pages ;
_billustrations ;
_c23 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aincludes bibliographical references and index.
505 _aI. Fundamental properties of X-rays -- II. Geometry of crystals -- III. Scattering and diffraction -- IV. Diffraction from polycrystalline samples and determination of crystal structure -- V. Reciprocal lattice and integrated intensities of crystals -- VI. Symmetry analysis for crystals and the use of the international tables -- VII. Supplementary problems(100 exercises) -- VIII. Solutions to supplementary problems.
700 1 _aMatsubara, Eiichiro
_9102090
700 1 _aShinoda, Kozo
_9102091
942 _cBK