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020 _a9783658359263
024 7 _a10.1007/978-3-658-35926-3
_2doi
040 _aTR-AnTOB
_beng
_erda
_cTR-AnTOB
041 _aeng
050 4 _aQC411
072 7 _aTTBL
_2bicssc
072 7 _aSCI053000
_2bisacsh
072 7 _aTTBL
_2thema
090 _aQC411EBK
100 1 _aTaudt, Christopher.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aDevelopment and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
_h[electronic resource] /
_cby Christopher Taudt.
250 _a1st ed. 2022.
264 1 _aWiesbaden :
_bSpringer Fachmedien Wiesbaden :
_bImprint: Springer Vieweg,
_c2022.
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _a1 Introduction and motivation -- 2 Related works and basic considerations -- 3 Surface profilometry -- 4 Polymer characterization -- 5 Thin-film characterization -- 6 Conclusion.
506 0 _aOpen Access
520 _aThis Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.
650 0 _aLasers.
650 0 _aOptical measurements.
650 0 _aMetrology.
650 1 4 _aLaser Technology.
650 2 4 _aOptical Metrology.
653 0 _aInterferometry
710 2 _aSpringerLink (Online service)
856 4 0 _uhttps://doi.org/10.1007/978-3-658-35926-3
_3Springer eBooks
_zOnline access link to the resource
942 _2lcc
_cEBK