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020 _a9783030895143
024 7 _a10.1007/978-3-030-89514-3
_2doi
040 _aTR-AnTOB
_beng
_cTR-AnTOB
_erda
041 _aeng
050 4 _aQC589
072 7 _aTJFC
_2bicssc
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
072 7 _aTJFC
_2thema
090 _aQC589EBK
100 1 _aFreeman, Yuri.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aTantalum and Niobium-Based Capacitors
_h[electronic resource] :
_bScience, Technology, and Applications /
_cby Yuri Freeman.
250 _a2nd ed. 2022.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2022.
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- 1: Major Degradation Mechanisms -- 2: Basic Technology -- 3: Applications -- 4: Conclusion.
520 _aThis book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb). Technology-related coverage includes chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated. The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics.
650 0 _aElectronic circuits.
650 0 _aElectronics.
650 1 4 _aElectronic Circuits and Systems.
650 2 4 _aElectronic Circuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
653 0 _aCapacitors
653 0 _aCapacitors -- Materials
710 2 _aSpringerLink (Online service)
856 4 0 _uhttps://doi.org/10.1007/978-3-030-89514-3
_3Springer eBooks
_zOnline access link to the resource
942 _2lcc
_cEBK