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003 | TR-AnTOB | ||
005 | 20231121102500.0 | ||
007 | cr nn 008mamaa | ||
008 | 211213s2022 sz | s |||| 0|eng d | ||
020 | _a9783030895143 | ||
024 | 7 |
_a10.1007/978-3-030-89514-3 _2doi |
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040 |
_aTR-AnTOB _beng _cTR-AnTOB _erda |
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041 | _aeng | ||
050 | 4 | _aQC589 | |
072 | 7 |
_aTJFC _2bicssc |
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072 | 7 |
_aTJFC _2bicssc |
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072 | 7 |
_aTEC008010 _2bisacsh |
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072 | 7 |
_aTJFC _2thema |
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072 | 7 |
_aTJFC _2thema |
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090 | _aQC589EBK | ||
100 | 1 |
_aFreeman, Yuri. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut |
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245 | 1 | 0 |
_aTantalum and Niobium-Based Capacitors _h[electronic resource] : _bScience, Technology, and Applications / _cby Yuri Freeman. |
250 | _a2nd ed. 2022. | ||
264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2022. |
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300 | _a1 online resource | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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505 | 0 | _aIntroduction -- 1: Major Degradation Mechanisms -- 2: Basic Technology -- 3: Applications -- 4: Conclusion. | |
520 | _aThis book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb). Technology-related coverage includes chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated. The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics. | ||
650 | 0 | _aElectronic circuits. | |
650 | 0 | _aElectronics. | |
650 | 1 | 4 | _aElectronic Circuits and Systems. |
650 | 2 | 4 | _aElectronic Circuits and Systems. |
650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
653 | 0 | _aCapacitors | |
653 | 0 | _aCapacitors -- Materials | |
710 | 2 | _aSpringerLink (Online service) | |
856 | 4 | 0 |
_uhttps://doi.org/10.1007/978-3-030-89514-3 _3Springer eBooks _zOnline access link to the resource |
942 |
_2lcc _cEBK |