000 03191nam a22005535i 4500
999 _c200458357
_d76569
003 TR-AnTOB
005 20231116161120.0
007 cr nn 008mamaa
008 220209s2022 si | s |||| 0|eng d
020 _a9789811651014
024 7 _a10.1007/978-981-16-5101-4
_2doi
040 _aTR-AnTOB
_beng
_erda
_cTR-AnTOB
041 _aeng
050 4 _aQH212.E4
072 7 _aTGM
_2bicssc
072 7 _aTEC021000
_2bisacsh
072 7 _aTGM
_2thema
090 _aQH212.E4EBK
245 1 0 _aElectron Microscopy in Science and Engineering
_h[electronic resource] /
_cedited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao.
250 _a1st ed. 2022.
264 1 _aSingapore :
_bSpringer Nature Singapore :
_bImprint: Springer,
_c2022.
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aIITK Directions,
_x2509-6605 ;
_v6
505 0 _aSmall scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.
520 _aThis issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.
650 0 _aMaterials.
650 0 _aSpectrum analysis.
650 0 _aBuilding materials.
650 1 4 _aMaterials Engineering.
650 2 4 _aSpectroscopy.
650 2 4 _aStructural Materials.
653 0 _aElectron microscopy
653 0 _aIndustrial applications
700 1 _aBiswas, Krishanu.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aSivakumar, Sri.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aGurao, Nilesh.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
710 2 _aSpringerLink (Online service)
830 0 _aIITK Directions,
_x2509-6605 ;
_v6
856 4 0 _uhttps://doi.org/10.1007/978-981-16-5101-4
_3Springer eBooks
_zOnline access link to the resource
942 _2lcc
_cEBK