000 01279 a2200349 4500
001 58501
999 _c58501
_d15014
003 TR-AnTOB
005 20200510112805.0
008 070126s1999 enk b i 001 0 eng
010 _a98046589
020 _a0471985015 (cloth : alk. paper)
020 _a0471985023 (paper : alk. paper)
040 _aDLC
_cDLC
_dDLC
041 _aeng
050 _aTA417.23
_b.B73 1999
090 _aTA417.23 .B73 1999
100 _aBrandon, D. G.
_931289
245 0 _aMicrostructural characterization of materials /
_cDavid Brandon and Wayne D. Kaplan.
264 1 _aChichester ;
_aNew York :
_bJ. Wiley,
_cc1999.
300 _axiii, 409 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 _aMaterials
_xMicroscopy
_931291
650 _aMicrostructure
_931292
700 _aKaplan, Wayne D.
_931290
856 4 _uhttp://www.loc.gov/catdir/description/wiley033/98046589.html
_3Publisher description
857 4 _uhttp://www.loc.gov/catdir/toc/onix03/98046589.html
_3Table of Contents
901 _a0018122
902 _aGT
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _cBK