000 01422 a2200373 4500
001 58503
999 _c58503
_d15016
003 TR-AnTOB
005 20200610110407.0
008 070126s1998 nyua b 001 0 eng
010 _a98016162
020 _a0521550564
020 _a0521559596 (pbk.)
040 _aDLC
_cDLC
_dDLC
041 _aeng
050 _aTK7871.99.M44
_bT38 1998
090 _aTK7871.99.M44 T38 1998
100 _aTaur, Yuan,
_d1946-
_931297
245 0 _aFundamentals of modern VLSI devices /
_cYuan Taur, Tak H. Ning.
264 1 _aCambrige, UK ;
_aNew York :
_bCambridge University Press,
_c1998.
300 _axxii, 469 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references (p. 449-460) and index.
650 0 _aBipolar transistors
_928482
650 _aIntegrated circuits
_xVery large scale integration
_931299
650 _aMetal oxide semiconductors, Complementary
_9392
700 _aNing, Tak H.,
_d1943-
_931298
856 4 _uhttp://www.loc.gov/catdir/toc/cam024/98016162.html
_3Table of contents
857 4 _uhttp://www.loc.gov/catdir/description/cam029/98016162.html
_3Publisher description
901 _a0018078
902 _aGT
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
991 _bc-GenColl
_hTK7871.99.M44
_iT38 1998
_tCopy 1
_wBOOKS
942 _cBK