| 000 | 01695 a2200421 4500 | ||
|---|---|---|---|
| 001 | 58838 | ||
| 999 |
_c58838 _d15040 |
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| 003 | TR-AnTOB | ||
| 005 | 20200514113345.0 | ||
| 008 | 070201s2001 nyua b 001 0 eng | ||
| 010 | _a2001017842 | ||
| 020 | _a0471239291 (alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 041 | _aeng | ||
| 042 | _apcc | ||
| 050 |
_aQ327 _b.K57 2001 |
||
| 090 | _aQ327 .K57 2001 | ||
| 100 |
_aKirby, Michael, _d1961- _931383 |
||
| 245 | 0 |
_aGeometric data analysis : _ban empirical approach to dimensionality reduction and the study of patterns / _cMichael Kirby. |
|
| 264 | 1 |
_aNew York : _bWiley, _cc2001. |
|
| 300 |
_axvii, 363 p. : _bill. ; _c25 cm. |
||
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references (p. 349-358) and index. | ||
| 650 |
_aYapay zeka _921327 |
||
| 650 |
_aArtificial intelligence _91543 |
||
| 650 |
_aPattern perception _929819 |
||
| 650 |
_aÖrüntü algısı _929821 |
||
| 650 |
_aÖrüntü tanıma sistemleri _928222 |
||
| 650 |
_aPattern recognition systems _91133 |
||
| 856 | 4 |
_uhttp://www.loc.gov/catdir/bios/wiley042/2001017842.html _3Contributor biographical information |
|
| 857 | 4 |
_uhttp://www.loc.gov/catdir/description/wiley034/2001017842.html _3Publisher description |
|
| 858 | 4 |
_uhttp://www.loc.gov/catdir/toc/onix05/2001017842.html _3Table of Contents |
|
| 901 | _a0018110 | ||
| 902 | _aGT | ||
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 925 | 0 |
_aacquire _b2 shelf copies _xpolicy default |
|
| 942 | _cBK | ||