000 00961 a2200313 4500
001 71786
003 TR-AnTOB
005 20240527100828.0
008 110504s1988 nyua b 001 0 d
020 _a0891166890 (v.1)
022 _a08977453
040 _aLIN
_cLIN
_dBGU
041 0 _aeng
050 _aTA418.58
_b.C64 1988
090 _aTA418.58 .C64 1988
100 _aBar-Cohen, Avram,
_d1946-
_946964
245 0 _aAdvances in thermal modeling of electronic components and systems :
_bvolume 1 /
_cAvram Bar-Cohen and Alan D. Kraus.
264 1 _aNew York :
_bHemisphere Publishing Corp.,
_c1988.
300 _av. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index.
590 _aProf.Dr. Sadık Kakaç tarafından bağışlanmıştır.
650 0 _aThermal stresses
_938174
700 _aKraus, Allan D.
_946965
902 _a0025264
903 _aMerkez Kütüphane
942 _cCR
_2lcc
945 _aGA, CS
999 _c71786
_d18072