000 | 02557 a2200325 4500 | ||
---|---|---|---|
999 |
_c73825 _d22020 |
||
001 | 73825 | ||
003 | TR-AnTOB | ||
005 | 20210409102035.0 | ||
008 | 090218s2008 sg a b 00010 eng | ||
020 | _a9780470822982 (cloth : alk. paper) | ||
020 | _a0470822988 (cloth : alk. paper) | ||
040 |
_aDLCcDLCdBAKERdBWXdYDXCPdUtOrBLW _cTR-AnTOB |
||
041 | _aeng | ||
050 |
_aTA403 _b.L46 2008 |
||
090 | _aTA403 .L46 2008 | ||
100 |
_aLeng, Yang _952279 |
||
245 | 0 |
_aMaterials characterization : _bintroduction to microscopic and spectroscopic methods / _cYang Leng. |
|
264 | 1 |
_aSingapore ; _aHoboken, NJ : _bJ. Wiley, _cc2008. |
|
300 |
_axii, 337 p. : _bill. ; _c26 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
505 |
_aX-ray Radiation--Light Microscopy-- _aOptical Principles -- _aInstrumentation-- _aSpecimen Preparation -- _aImaging Modes -- _aConfocal Microscopy -- _aX-ray Diffraction Methods -- _aTheoretical Background of Diffraction -- _aX-ray Diffractometry-- _aTransmission Electron Microscopy-- _aInstrumentation-- _aSpecimen Preparation -- _aImage Modes -- _aSelected Area Diffraction -- _aImages of Crystal Defects -- _aScanning Electron Microscopy -- _aInstrumentation-- _aContrast Formation -- _aOperational Variables -- _aSpecimen Preparation -- _aScanning Probe Microscopy -- _aInstrumentation -- _aScanning Tunneling Microscopy -- _aAtomic Force Microscopy -- _aImage Artifacts -- _aX-ray Spectroscopy for Elemental Analysis -- _aFeatures of Characteristic X-rays -- _aX-ray Fluorescence Spectrometry -- _aEnergy Dispersive Spectroscopy in Electron Microscopes -- _aQualitative and Quantitative Analysis -- _aElectron Spectroscopy for Surface Analysis -- _aBasic Principles -- _aInstrumentation-- _aCharacteristics of Electron Spectra -- _aQualitative and Quantitative Analysis -- _aSecondary Ion Mass Spectrometry for Surface Analysis -- _aBasic Principles -- _aInstrumentation-- _aSurface Structure Analysis -- _aSIMS Imaging -- _aSIMS Depth Profiling -- _aVibrational Spectroscopy for Molecular Analysis -- _aTheoretical Background -- _aFourier Transform Infrared Spectroscopy -- _aRaman Microscopy -- _aInterpretation of Vibrational Spectra -- _aThermal Analysis -- _aCommon Characteristics -- _aDifferential Thermal Analysis and Differential Scanning Calorimetry-- _aThermogravimetry -- _aIndex |
||
650 | 7 |
_aMalzemeler _2etuturkob _959534 |
|
650 |
_aMaterials _91533 |
||
650 |
_aMaterials _xAnalysis _952280 |
||
650 |
_aMalzemeler _xAnaliz _952281 |
||
902 | _a0028144 | ||
903 | _aMerkez Kütüphane | ||
942 |
_cBK _2lcc |
||
945 | _aMC, CS |