| 000 | 01561 a2200373 4500 | ||
|---|---|---|---|
| 001 | 74115 | ||
| 999 |
_c74115 _d22288 |
||
| 003 | TR-AnTOB | ||
| 005 | 20200607111905.0 | ||
| 008 | 090317s2008 gw 00100 eng | ||
| 020 | _a9783540738862 | ||
| 020 | _a354073886X | ||
| 041 | _aeng | ||
| 050 | 0 |
_aTA417.23 _b.F85 2008 |
|
| 090 | _aTA417.23 .F85 2008 | ||
| 100 |
_aFultz, Brent _953184 |
||
| 245 | 0 |
_aTransmission electron microscopy and diffractometry of materials / _cBrent Fultz, James Howe. |
|
| 264 | 1 |
_aBerlin ; _aNew York : _bSpringer, _c2008. |
|
| 300 |
_axix, 758 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographies and index. | ||
| 504 | _aKaynakça: s.677-689 ve dizin. | ||
| 505 |
_aDiffraction and the x-ray powder diffractometer -- _tThe TEM and its optics -- _tScattering -- _tInelastic electron scattering and spectroscopy -- _tDiffraction from crystals -- _tElectron diffraction and crystallography -- _tDiffraction contrast in TEM images -- _tDiffraction lineshapes -- _tPatterson functions and diffuse scattering -- _tHigh-resolution TEM imaging -- _tHigh-resolution STEM imaging -- _tDynamical theory. |
||
| 650 | 0 |
_aX-ray diffractometer _953189 |
|
| 650 | 7 |
_aX-ray difraktometre _2etuturkob _953190 |
|
| 650 |
_aTransmisyon elektron mikroskopi _953188 |
||
| 650 |
_aTransmission electron microscopy _953187 |
||
| 650 |
_aMalzemeler _xMikroskopi _953186 |
||
| 650 |
_aMaterials _xMicroscopy _931291 |
||
| 700 |
_aHowe, James M., _d1955- _953185 |
||
| 902 | _a0028357 | ||
| 903 | _aMerkez Kütüphane | ||
| 945 | _aOG,CS | ||
| 942 | _cBK | ||