000 01438 a2200373 4500
001 76515
999 _c76515
_d2704
003 TR-AnTOB
005 20200806130519.0
008 090911s2006 enka b 00100 eng
020 _a9780198570547 (alk. paper)
035 _a76515
041 _aeng
050 _aQC278
_b.E45 2006
090 _aQC278 .E45 2006
100 _aEkin, J. W.
_959932
245 0 _aExperimental techniques for low-temperature measurements :
_bcryostat design, material properties, and superconductor critical-current testing /
_cJack W. Ekin.
264 1 _aOxford ;
_aNew York :
_bOxford University Press,
_c2006.
300 _axxviii, 673 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index.
650 _aDüşük sıcaklıklar
_xAletler
_959936
650 0 _aSuperconductors
_959822
650 _aLow temperatures
_xMeasurement
_959933
650 _aLow temperatures
_xInstruments
_959934
650 _aDüşük sıcaklıklar
_xÖlçüm
_959935
650 0 _aLow temperature research
_959937
650 7 _aDüşük sıcaklık araştırması
_2etuturkob
_959938
650 7 _aSüper iletkenler
_2etuturkob
_959939
856 4 _uhttp://www.loc.gov/catdir/enhancements/fy0640/2006010332-d.html
_3Publisher description
857 _uhttp://www.loc.gov/catdir/enhancements/fy0640/2006010332-t.html
_3Table of contents
902 _a0031454
903 _aMerkez Kütüphane.
945 _aÖ.Ö,C.Ş
942 _cBK