| 000 | 01406 a2200409 4500 | ||
|---|---|---|---|
| 001 | 76727 | ||
| 999 |
_c76727 _d24629 |
||
| 003 | TR-AnTOB | ||
| 005 | 20200510112809.0 | ||
| 008 | 091013s2008 enka b 001 0 eng | ||
| 020 | _a0470027843 (cloth) | ||
| 020 | _a9780470027844 (cloth) | ||
| 020 | _a0470027851 (pbk.) | ||
| 020 | _a9780470027851 (pbk.) | ||
| 040 |
_aDLC _cDLC _dBTCTA _dBAKER _dYDXCP _dZQP _dBWX _dUtOrBLW |
||
| 041 | _aeng | ||
| 050 |
_aTA417.23 _b.B73 2008 |
||
| 090 | _aTA417.23 .B73 2008 | ||
| 100 |
_aBrandon, D. G. _931289 |
||
| 245 | 0 |
_aMicrostructural characterization of materials / _cDavid Brandon and Wayne D. Kaplan. |
|
| 250 | _a2nd ed. | ||
| 264 | 1 |
_aChichester, England : _bJohn Wiley, _cc2008. |
|
| 300 |
_axiv, 536 p. : _bill. (some col.) ; _c25 cm. |
||
| 490 | 0 | _aQuantitative software engineering series. | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 |
_aMalzemeler _xMikroskopi _953186 |
||
| 650 |
_aMaterials _xMicroscopy _931291 |
||
| 650 |
_aMicrostructure _931292 |
||
| 650 |
_aMikroyapı _954108 |
||
| 700 |
_aKaplan, Wayne D. _931290 |
||
| 856 | 4 |
_uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html _3Table of contents only |
|
| 857 | 4 |
_uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-d.html _3Publisher description |
|
| 902 | _a0031664 | ||
| 903 | _aMerkez Kütüphane | ||
| 945 | _aMC, CT | ||
| 942 | _cBK | ||